The application of Leica EM sample preparation instruments in damage evaluation

Sufang Wu

Leica Microsystems (Shanghai) Trading Co., Ltd, Beijing, China

EXTENDED ABSTRACT: It is significant to expose the defects in materials really and without stress damage in damage evaluation. During defect-exposing, it doesn’t only require high-precision location, but strict control of stress damage in the whole sample preparation process. Moreover, it is also necessary to take temperature sensitivity, preparation and transfer environment, sample carrier into consideration. 

Be beneficial to high-quality stereoscopic microscope in Leica’s instruments, the samples can be observed, and parameters can be adjusted during whole preparation process, which can achieve target of high-precision location. Thanks to unique gravity drop cutting mode and Backlash-free segment arm of EM UC7/FC7, slices can be prepared with uniform section thickness. The stress damage on the surface can be removed by ion cutting or milling via EM TIC3X. In addition, the temperature-sensitive materials can be protected by frozen mode (minimum temperature is -160°C). The versatile vacuum cryo transfer system, EM VCT500, has been designed to transfer specimens under well-defined conditions between various devices without contamination. Tailored components allow the upgrading of room temperature preparation systems and room temperature analysis systems to cryo systems.